Effect of size on dielectric constant for low dimension materials |
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| Authors: | M TianM Li JC Li |
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| Institution: | a Key Laboratory of Automobile Materials (Jilin University), Ministry of Education and School of Materials Science and Engineering, Jilin University, Changchun 130022, China
b Department of Physics, Huaibei Normal University, Huaibei 235000, China |
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| Abstract: | Based on the consideration on size-dependent root of mean-square displacement of vibration of atoms (rms) σ(D), where D denotes the diameter of nanoparticles and nanowires or the thickness of thin films, size-dependent dielectric constants of low-dimensional materials are modeled without any adjustable parameter. The model predicts a decrease or an increase in dielectric constants with drop of D. The predicted results correspond to experimental and other theoretical results for particles and thin films of Si, CdSe, GaAs, H2O and thiol. |
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| Keywords: | Dielectric constant Dimension materials Size-dependence |
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