基于单元分类的CMOL常开缺陷单元容错映射

CMOS纳米分子混合电路(CMOS/nanowire/MOLeclular hybrid circuits, CMOL)在制造过程中会引入较高缺陷率, 从而导致可用映射资源的减少. 针对由此产生的映射困难问题, 本文采用单元分类思想, 对部分缺陷单元加以利用, 以增加可映射单元数, 进而提高映射成功率. 首先根据单元缺陷类型的差异, 将缺陷单元分为可用和不可用两类进行标记, 然后对可用缺陷单元加以利用, 并采用改进的进化算法完成单元容错映射. 实验结果表明, 与已有方法相比, 新方法在运行效率和成功率上分别得到了19.17%和30.14%的提升.

Cell classification based CMOL stuck-at-open defect-tolerant cell mapping

To tackle the problem of high defect rate in CMOS/nanowire/MOLeclular hybrid circuits (CMOL), a cell classification based defect-tolerant cell mapping method is proposed. First, recoverable and unrecoverable defective cells are marked, and the recoverable defective ones are put to use again. Then, a modified evolutionary algorithm is used to complete the defect-tolerant cell mapping. Compared with the existing approaches, the CPU time and success rate using the proposed method are optimized to 19.17% and 30.14%, respectively.