Einige Aspekte der Quantitativen Röntgenemissionsanalyse Leichter Elemente bei Anregung Mit Schweren Teilchen

The aim of the paper is the simplification of calibration procedures in the investigation of multi-element-systems by calculating calibration curves. This requires, as well as taking into account the measuring geometry and the detector properties, above all the calculation of the number of the characteristic X-rays emitted by the sample per incident particle. For the calculation of the thick target yield a computer programme has been developed which makes possible a simple exchange of subroutines describing the stopping power of the sample, the cross-section of K-shell ionization, the fluorescence yield and the matrix absorption for the resulting K-X-rays of the elements contained in the sample. The agreement between experiment and calculation is discussed, when various approximations for the functions mentioned are used, as well as the possible influence of the grain size and surface roughness of the samples on the measurements, on which the calculations are based.