X-ray characterization of graphite intercalation compounds |
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| Authors: | S.Y. Leung C. Underhill G. Dresselhaus T. Krapchev R. Ogilvie M.S. Dresselhaus |
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| Affiliation: | Massachusetts Institute of Technology, Cambridge, MA 02139, USA |
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| Abstract: | The understanding of electronic and lattice properties of graphite intercalation compounds depends critically on the model describing the structural properties. We report here results showing that well-staged as-grown samples do not exhibit the expected in-plane intercalant density, and that careful analysis of the 00? x-ray diffractograms reveals important information on the in-plane occupation probability. |
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