Study of molecular beam epitaxy of cadmium telluride on sapphire |
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Authors: | V I Mikhailov A V Butashin V M Kanevsky L E Polyak E V Rakova A E Moslemov and V B Kvartalov |
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Institution: | (1) Materials Team Leader, SELEX Sensors and Airborne Systems Infrared Ltd., Millbrook Industrial Estate, PO Box 217, SO15 0EG Southampton, Hampshire, UK |
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Abstract: | The effect of thermal treatment of (0001) sapphire substrates on the structure of cadmium telluride films grown by molecular
beam epitaxy was investigated. The growth process was carried out on a laboratory facility equipped with a mass spectrometer
and electron diffractometer. It was established that no annealing or annealing in vacuum (P < 0.13 Pa) results in the growth of polycrystalline CdTe films. Epitaxial CdTe films with a cubic structure of the sphalerite
type oriented with the (111) plane parallel to the substrate grow on the substrates annealed in air at T > 1000°C. Electron diffraction patterns showed that they have a mosaic structure and contain twins with the 〈111〉 twinning
axis. Atomic-force microscopic images revealed CdTe crystallites with lateral sizes of ∼50 nm arranged along the steps on
the sapphire substrate surface. These results allowed the conclusion to be drawn that the growth of CdTe on sapphire substrates
can occur by the formation of the three-dimensional nucleation centers according to the Volmer-Weber mechanism. |
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