Surface and interfacial segregation of polyethersulfone deuterated chain ends determined by neutron reflectivity |
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| Authors: | Katrina M Knauer Joel Pollino Jonathan Schwartz Levi M J Moore Sarah E Morgan |
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| Institution: | 1. School of Polymers and High Performance Materials, The University of Southern Mississippi, Hattiesburg, Mississippi;2. Solvay Specialty Polymers, Alpharetta, Georgia |
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| Abstract: | The surface localization of polymer chain ends has been shown to be an effective method for surface composition control in amorphous polymer films. This work determines chain end distribution in thin polyethersulfone (PESU) films end‐capped with deuterated compounds of varying size and composition. Neutron reflectivity revealed the preferential localization of chain ends to the PESU‐air interface, independent of chain end identity. The length scale of the chain end concentration gradient was determined to differ from that predicted for flexible chain polymers. Atomic force microscopy and contact angle analysis demonstrated that chain end localization allows for improved control of nanoscale and macroscale surface properties of PESU films. © 2016 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2017 , 55, 293–301 |
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| Keywords: | light scattering neutron reflectivity poly(ether sulfones) semi‐rigid and rigid rod polymers surfaces |
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