Method for edge contour extraction of a scanning probe microscope image

A method for edge contour extraction of a scanning probe microscope image is proposed. This method is developed to process an image that has the large size irregularity and/or objects bound together. It is based on definition of the local minimum points of brightness data function and permits one to obtain the correct edge contour line. The advantages of the proposed method over traditional methods are demonstrated using model results. This method can be used to process different images.