X-ray tomography of microdefects using a detector with nonuniform surface sensitivity |
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Authors: | A. V. Likhachev |
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Affiliation: | 1500. Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, 630090, Russia
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Abstract: | Transmission tomography is considered for the case of the variable surface sensitivity of a detector. An equation is proposed for a 2D problem that is a correlation between measured intensity and the distribution of extinction coefficient. A method is developed that reduces reconstruction to searching for a system of linear algebraic equations. Simulation experiments demonstrate its advantages over beam tomography approximation. |
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