Studying variations in the elemental composition of annual layers in microsections of lake teletskoye sediments by means of scanning X-ray fluorescent microanalysis using synchrotron radiation |
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| Authors: | A V Dar’in I A Kalugin Ya V Rakshun |
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| Institution: | 1525. Sobolev Institute of Geology and Mineralogy, Siberian Branch, Russian Academy of Sciences, Novosibirsk, 630090, Russia
2525. Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, 630090, Russia
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| Abstract: | SR scanning XRF is used to analyze the annual elemental layers of bottom sediments from Lake Teletskoye. Scanning is conducted with a pitch of 0.1 mm at energies of 16, 24, and 38 keV. The content of more than 15 elements are determined: K, Ca, Ti, Mn, Fe, V, Cr, Ni, Cu, Zn, As, Rb, Sr, Y, Zr, Cd, Sn, I, and Ba (range of concentrations, 0.005–10%). A cross section containing (1) the upper part of an underlying layer, (2) the total annual layer, (3) one more complete layer, and (4) the lower part of an overlapping layer is measured. Geochemical indicators reflecting the rhythm of annual precipitation are found. |
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