The Formation of Analytical and Background Signals in Radioisotope X-ray Fluorescence Analysis Using a 241Am Radioactive Source and a Si(Li) Detector |
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| Authors: | A Yu Portnoi G V Pavlinskii A Yu Dukhanin P Zuzaan B Erdemchimeg |
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| Institution: | (1) Research Institute of Applied Physics, Irkutsk State University, bul'v. Gagarina 20, Irkutsk, 664003, Russia;(2) Irkutsk State Medical University, ul. Krasnogo vosstaniya 1, Irkutsk, 664003, Russia;(3) Mongolian State University, P.O. Box 46-337, Ulan Bator, Mongolia |
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| Abstract: | Reasons for the appearance of a background signal in the relatively soft x-ray range (2–15 keV) upon fluorescence excitation with the 241Am radioisotope are discussed. Mathematical models are proposed for the interaction of the radiation of the radioactive source with the sample and the Si(Li) detector, capable of describing the appearance of the analytical and background signals. It was shown that processes occurring in the Si(Li) detector should be taken into account to explain and calculate the background signal in this range. The results of calculations agree well with the experimental data obtained using an 241Am radiation source for fluorescence excitation. |
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