Quantitative nanoscopic impedance measurements on silver-ion conducting glasses using atomic force microscopy combined with impedance spectroscopy

Nanoscopic impedance measurements were carried out on silver ion conducting glasses by coupling an impedance spectrometer with an atomic force microscope. When ac voltages were applied to a conducting AFM tip being in contact with the glass surface, silver nanoparticles were formed during the cathodic half cycle, which were not completely reoxidized in the anodic half cycle. We describe two protocols allowing for a controlled particle growth. The electrochemical oxidation/reduction processes led to low tip/sample interfacial impedances, and the formed silver particles acted as nanoelectrodes sensing the spreading resistance of the glass below the particles. We made a quantitative check of the spreading resistance formula under the assumption that spreading of the electric field is governed by the lateral diameter of the particles and found good agreement between the mean value of the local conductivities obtained at different tip positions and the macroscopic conductivity.