首页 | 本学科首页   官方微博 | 高级检索  
     


Fick's law of diffusion depth profiles applied to the degradation of oxidized polystyrene during ARXPS analysis
Abstract:Angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) measurements were made, using Al Kα and Mg Kα radiation alternately, on a polystyrene sample that had been exposed to a helium plasma. It was observed that oxygen was introduced into the sample surface by the plasma treatment, and that some of it was lost over a period of 5 h under x‐ray irradiation in the vacuum of the spectrometer. Laplace transforms of Fick's law of diffusion profiles were derived and applied to the data. The ARXPS results obtained in this study are consistent with a sample history in which the oxidation of the polymer surface resulting from exposure to plasma is controlled by a diffusion process, whereas the loss of oxygen during exposure to x‐rays is principally controlled by a first‐order reaction such as the liberation of oxygen (presumably as CO2) from carbon–oxygen groups by the action of radicals created by the ionizing radiation. Copyright © 2005 John Wiley & Sons, Ltd.
Keywords:XPS  ARXPS  polymer degradation  polystyrene  helium plasma  Fick's law of diffusion
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号