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Electrical characterization of the slow boron oxygen defect component in Czochralski silicon |
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| Authors: | Tim Niewelt Jonas Schön Juliane Broisch Wilhelm Warta Martin Schubert |
| Affiliation: | Fraunhofer Institute for Solar Energy Systems ISE, Freiburg, Germany |
| Abstract: | |
| Keywords: | light‐induced degradation boron oxygen defects silicon electrical parameterization lifetime spectroscopy |