Direct detection of carrier traps in Si solar cells after light‐induced degradation |
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Authors: | Teimuraz Mchedlidze Jörg Weber |
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Affiliation: | Technische Universit?t Dresden, Dresden, Germany |
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Abstract: | In solar cells fabricated from boron‐doped Cz‐Si wafers minority and majority carrier traps were detected by deep level transient spectroscopy (DLTS) after so‐called “light‐induced degradation” (LID). The DLTS signals were detected from mesa‐diodes with the full structure of the solar cells preserved. Preliminary results indicate metastable traps with energy levels positioned at EV + 0.37 eV and EC – 0.41 eV and apparent carrier capture cross‐sections in the 10–17–10–18 cm2 range. The concentration of the traps was in the range of 1012–1013 cm–3. The traps were eliminated by annealing of the mesa‐diodes at 200 °C. No traps were detected in Ga‐doped solar cells after the LID procedure or below the light protected bus bar locations in B‐doped cells. (© 2015 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim) |
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Keywords: | light‐induced degradation carrier traps DLTS |
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