|
|||||
|
|
Capacitively coupled measurements of the quantized hall effect in silicon inversion layers |
|
| Authors: | T.P. Smith P.J. Stiles |
| Affiliation: | Physics Department, Brown University Providence, R. I. 02912 USA |
| Abstract: | We report the observation of the quantized Hall effect in silicon inversion layers using capacitors in place of ohmic contacts. Measurements were made at frequencies between 5.00 and 100.0 kHz. |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ | |