Structural and IR studies on Cu-Ti mixed ferrite |
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Authors: | A Elfalaky |
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Institution: | (1) Institut für Nukleare Festkörperphysik, Universität der Bundeswehr München, D-85577 Neubiberg, Germany;(2) Institut für Physik, Fakultät für Elektrotechnik, Universität der Bundeswehr München, D-85577 Neubiberg, Germany |
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Abstract: | The sensitivity of the positron to the internal electric fields in good quality thin ( 100 nm) Molecular Beam Epitaxy (MBE)-grown layers is experimentally demonstrated. Both a thin intrinsic layer grown on a p-type substrate and a highly n-doped profile buried in intrinsic silicon form effective barriers to positron diffusion although no defects can be detected. We also extract, from a full treatment of the positron diffusion, a quantitative estimate of the concentration, below the detection limits of other methods, of large vacancy clusters in a thick (680 nm) film. |
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Keywords: | 71 65 73 40 Lq 73 60 Fw 78 70 Bj |
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