Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector |
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| Authors: | Calegari F Valentini G Vozzi C Benedetti E Cabanillas-Gonzalez J Faenov A Gasilov S Pikuz T Poletto L Sansone G Villoresi P Nisoli M De Silvestri S Stagira S |
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| Institution: | National Laboratory for Ultrafast and Ultraintense Optical Science, CNR-INFM, Politecnico, Milan, Italy. |
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| Abstract: | Elemental sensitivity in soft x-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft x-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers. |
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