| 用高分辨电子显微术直接鉴定ZnS多型体中堆垛序列和缺陷 |
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| 引用本文： | 康振川. 用高分辨电子显微术直接鉴定ZnS多型体中堆垛序列和缺陷[J]. 物理学报, 1982, 31(5): 664-667 |
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| 作者姓名： | 康振川 |
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| 作者单位： | 北京市冶金研究所 |
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| 摘 要： | 用倾斜束照明的电子显微术在分辨率为3.12?的水平上摄照了点阵象,直接观察了ZnS多型体的堆垛次序,这方法被用于揭示ZnS堆垛的无序和层错。关键词：
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| 收稿时间： | 1981-06-08 |
THE DIRECT DETERMINATION OF STACKING FAULTS SEQUENCE IN ZnS POLYTYPE BY HIGH RESOLUTION ELECTRON MICROSCOPY |
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| KANG ZHEN-CHUAN. THE DIRECT DETERMINATION OF STACKING FAULTS SEQUENCE IN ZnS POLYTYPE BY HIGH RESOLUTION ELECTRON MICROSCOPY[J]. Acta Physica Sinica, 1982, 31(5): 664-667 |
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| Authors: | KANG ZHEN-CHUAN |
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| Abstract: | Lattice imaging with tilted illumination at the 3.12? level has been used for direct determination of stacking sequences in ZnS polytype by observing electron micrographs. The method employed is used to reveal the stacking sequences in the disordered and faulted ZnS.
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