首页 | 本学科首页   官方微博 | 高级检索  
     检索      

原子力显微镜在聚合物溶液结构研究中的应用
引用本文:张瑞,叶仲斌,罗平亚.原子力显微镜在聚合物溶液结构研究中的应用[J].电子显微学报,2010,29(5):475-481.
作者姓名:张瑞  叶仲斌  罗平亚
作者单位:油气藏地质及开发工程国家重点实验室,西南石油大学,四川成都,610500
基金项目:科技部"863"计划资助项目,油气藏地质及开发工程国家重点实验室开放基金资助项目 
摘    要:驱油用水溶性聚合物溶液的应用性能由其聚合物溶液的微观结构所决定,因此在驱油用聚合物合成及配方研究中迫切需要研究其溶液的微观结构。本文使用原子力显微镜(AFM)、环境扫描电镜(ESEM)和透射电镜(TEM)观察了水溶液中聚合物(HAWSP,AP-P4)的微观结构。研究发现常温常压下原子力显微镜观察到的聚合物网络结构图案清晰,边界分辨率高。透射电镜观察到的聚合物网络结构较模糊且网络结构有断裂现象。环境扫描电镜观测到的网络结构尺寸大小是AFM观测到的几倍甚至是十几倍。动态光散射(dynamic light scattering,DLS)结果证明AFM和TEM所观测到的聚合物结构最接近于真实结构。结果表明使用原子力显微镜在观察水溶性聚合物类样品时,能够较真实反映其微观结构。

关 键 词:水溶性聚合物  网络结构  原子力显微镜  环境扫描电子显微镜  透射电子显微镜

The atomic force microscopy study on the microstructure of the polymer solution
ZHANG Rui,YE Zhong-bin,LUO Ping-ya.The atomic force microscopy study on the microstructure of the polymer solution[J].Journal of Chinese Electron Microscopy Society,2010,29(5):475-481.
Authors:ZHANG Rui  YE Zhong-bin  LUO Ping-ya
Institution:ZHANG Rui,YE Zhong-bin,LUO Ping-ya(State Key Lab of Oil and Gas Reservoir Geology and Exploitation,Southwest Petroleum University,Chengdu Sichuan 610500,China)
Abstract:The application properties of polymers for flooding are determined by their microstructures.So it is important to study on the microstructures of synthesization and direction of polymer.AFM、ESEM and TEM are used to observe the microstructures of the polymers.The AFM graphs show that the pattern of the network structure is clearer than the other two microscopies.The ESEM graphs show that the size dimension of the network structure is several times of the other two methods.The TEM graphs show that the pattern of the network structure is indistinct.Combining the data of DLS,the AFM and TEM can give the actual microstructure of the polymers.The data indicates that AFM is more suitable to observe the water-soluble polymers because of the simple sampling preparation,normal temperature and pressure.
Keywords:water-soluble polymer  network microstructure  atomic force microscopy(AFM)  environmental scanning electron microscopy(ESEM)  transmission electron microscopy(TEM)  
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号