Tip–surface interactions in noncontact atomic force microscopy on reactive surfaces

The imaging process in noncontact atomic force microscopy (AFM) is studied on a number of reactive surfaces, namely, the Takayanagi reconstructed Si(111), InP(110), and GaAs(110). We show that on these surfaces, the short-range dangling-bond type of interaction between the tip and the surface is decisive in achieving atomic resolution. The short-range tip–surface interaction is modeled in the density functional theory within the GGA approximation. We show that we can achieve quantitative agreement with the experimental data in the commonly used frequency modulation technique for AFM surface corrugation with a very simple model for the tip geometry treating the tip–surface interaction in the perturbation theory. The nature of the short-range tip–surface interaction on the three surfaces is considered and the consequences thereof for the experiments is discussed.