|
|||||
|
|
An RTL Abstraction Technique for Processor Microarchitecture Validation and Test Generation |
|
| Authors: | Jian Shen Jacob A Abraham |
| Institution: | (1) Computer Engineering Research Center, The University of Texas at Austin, ENS 424, Austin, TX 78712, USA;(2) Computer Engineering Research Center, The University of Texas at Austin, ENS 424, Austin, TX 78712, USA |
| Abstract: | |
| Keywords: | microprocessor design validation test generation coverage measurement |
| 本文献已被 SpringerLink 等数据库收录！ | |