Atomic force microscopy study for supermolecular microstructures in side-chain liquid crystalline polymer films

Atomic force microscopy (AFM) is employed to study the supermolecular microstructures of disclinations and inversion walls in thin films of a smectic side-chain liquid crystalline polymer. Two-dimensional nanostripes are formed in thin films when the material enters the smectic phase. A possible mechanism for their formation is also suggested. The stripes run parallel to the local director and thus decorate the overall patterns of nematic director around the disclinations and inversion walls. Three patterns involving radial, spiral, and circular supermolecular microstructures of a positive disclination with s = +1 and one hyperbolic pattern of a negative disclination with s = -1 are observed. The cores of all these microstructures exhibit circular dark centers in AFM height images. It is found that the specific configurations of a pair of (+1, -1) disclinations form during the late stage of annihilation and inversion walls always separate a pair of (+1, +1) disclinations. The analysis on the director fields around disclinations and inversion walls shows that the bend and splay elastic constants are of the same order of magnitude in the side-chain liquid crystalline polymer.