| 现代X射线荧光分析艺术 |
| |
| 引用本文： | Uhlig,S 王莉莉.现代X射线荧光分析艺术[J].分析试验室,1993,12(3):65-67,69. |
| |
| 作者姓名： | Uhlig S 王莉莉 |
| |
| 作者单位： | Siemens AG AUT V371 P. O. BOX 211262，Germany，Siemens AG AUT V371 P. O. BOX 211262，Germany，宁波西门子分析仪器维修站，北京钢铁研究总院 浙江 315010，北京 100081 |
| |
| 摘 要： |
|
| 关 键 词： | 荧光分析 荧光光谱仪 X辐射 |
The Art of Modern X- Ray Fluorescence Analysis |
| |
| Uhlig S,Peter W M.The Art of Modern X- Ray Fluorescence Analysis[J].Chinese Journal of Analysis Laboratory,1993,12(3):65-67,69. |
| |
| Authors: | Uhlig S Peter W M |
| |
| Abstract: | Modern elemental analysis using a wavelength-dispersive X-ray spectrometer ensures a non-destructive and environmentally safe analytical method. All elements from beryllium to uranium can be determined qualitatively, semi-quantitatively and quantitatively in solids, powders and liquids. |
| |
| Keywords: | X- ray fluorescence analysis X-ray spectrometry |
| 本文献已被 CNKI 维普 等数据库收录！ |
|
