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长焦距光学系统杂光系数测试仪
引用本文:高万荣 查冠华. 长焦距光学系统杂光系数测试仪[J]. 光子学报, 1996, 25(6): 537-540
作者姓名:高万荣 查冠华
作者单位:中国科学院西安光学精密机械研究所空间光学研究室
摘    要:报告了一种新的长焦距光学系统杂光系数测量装置,该装置除具有避免了制作大直径积分球的优点外,还能精确测量轴外杂光系数,分析各部分杂光源对杂光系数的影响.

关 键 词:长焦距光学系统  杂光系数  杂光源
收稿时间:1995-04-26

THE DEVICE FOR THE MEASUREMENT OF THE VEILING GLARE INDEX OF LONG FOCAL OPTICAL SYSTEM
Gao Wanrong,Zha Guanhua,Miao Xinghua, Pan Laijun,Zhang Xingzhen,Ling Yunmian, Qin Bin,Xue Mingqiu. THE DEVICE FOR THE MEASUREMENT OF THE VEILING GLARE INDEX OF LONG FOCAL OPTICAL SYSTEM[J]. Acta Photonica Sinica, 1996, 25(6): 537-540
Authors:Gao Wanrong  Zha Guanhua  Miao Xinghua   Pan Laijun  Zhang Xingzhen  Ling Yunmian   Qin Bin  Xue Mingqiu
Affiliation:Space Optics Department, Xi’an Institute of Optics and Precision Mechanics, Academia Sinica Xi’an 710068
Abstract:This paper presents a new device for measuring the veiling glare index of long focal lengthoptical system. The device can make the precise measurements of veiling glare index at an extra-axialobject point and analyze the influence of each stray light source on the veiling glare index as well asavoiding making the large diameter integrating sphere.
Keywords:Long focal length optical system  Veiling glare index  Stray light sources
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