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Bayesian inference for dependent elliptical measurement error models
Authors:Ignacio Vidal  Reinaldo B. Arellano-Valle
Affiliation:aInstituto de Matemática y Física, Universidad de Talca, Casilla 721, Chile;bPontificia Universidad Católica de Chile, Chile
Abstract:In this article we provide a Bayesian analysis for dependent elliptical measurement error models considering nondifferential and differential errors. In both cases we compute posterior distributions for structural parameters by using squared radial prior distributions for the precision parameters. The main result is that the posterior distribution of location parameters, for specific priors, is invariant with respect to changes in the generator function, in agreement with previous results obtained in the literature under different assumptions. Finally, although the results obtained are valid for any elliptical distribution for the error term, we illustrate those results by using the student-t distribution and a real data set.
Keywords:AMS subject classifications: primary, 62F15   secondary, 62J99
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