Atomic structure of a thin silica film on a Mo(112) substrate: a two-dimensional network of SiO4 tetrahedra |
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| Authors: | Weissenrieder J Kaya S Lu J-L Gao H-J Shaikhutdinov S Freund H-J Sierka M Todorova T K Sauer J |
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| Affiliation: | Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin, Germany. |
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| Abstract: | The structure of a thin single crystalline SiO(2) film grown on Mo(112) has been studied by scanning tunneling microscopy, infrared reflection absorption spectroscopy, and x-ray photoelectron spectroscopy. In excellent agreement with the experimental results, density functional theory calculations show that the film consists of a two-dimensional network of corner sharing [SiO(4)] tetrahedra, with one oxygen of each tetrahedron binding to the protruding Mo atoms of the Mo(112) surface. |
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