| Abstract: | The crystalline structures of “microlayer” and “nanolayer” polyethylene have been examined in coextruded films comprised of alternating layers of high-density polyethylene and polystyrene. Transmission electron microscopy (TEM), small-angle x-ray scattering (SAXS), and wide-angle x-ray scattering (WAXS) reveal that microlayer polyethylene, where the layer thickness is on the order of several microns, crystallizes with the normal unoriented lamellar morphology. In nanolayer films, where the film thickness of tens of nanometers is on the size scale of molecular dimensions, lamellae are oriented with the long axes perpendicular to the extrusion direction in a row-nucleated morphology similar to structures described in the literature. The lamellae are partially twisted about the long axes. The preferred twist angles of ±40° orient the lamellar surfaces normal to the layer surface. The row-nucleated morphology imparts highly anisotropic mechanical properties to the nanolayer polyethylene. |
