| Structural Analysis of Ultra—thin Metallic Multilayers by X—ray Anomalous Scattering Techniques at Diffraction Station |
| |
| 引用本文： | G.M.Luo J.Wang 等.Structural Analysis of Ultra—thin Metallic Multilayers by X—ray Anomalous Scattering Techniques at Diffraction Station[J].北京同步辐射装置,2001(1):133-136. |
| |
| 作者姓名： | G.M.Luo J.Wang |
| |
| 作者单位： | [1]InstituteofPhysics＆CenterofCondensedMatter,ChineseAcademyofSciences100080,Beijing [2]BSRF，ChineseAcadem,ChineseAcademyofSciences100080,Beijing |
| |
| 摘 要： |
|
| 关 键 词： | 超薄金属多层膜 X射线反常散射 结构分析 |
| 本文献已被 维普 等数据库收录！ |
|
