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Local leakage current behaviours of BiFeO₃ films

Authors:	Zou Cheng Chen Bin Zhu Xiao-Jian Zuo Zheng-Hu Liu Yi-Wei Chen Yuan-Fu Zhan Qing-Feng and Li Run-Wei

Institution:	State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China; Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Material Technology and Engineerin;Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China; Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institu;Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China; Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institu;Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China; Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institu;Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China; Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institu;State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China;Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China; Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institu;Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China; Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institu

Abstract:	The leakage current behaviours of polycrystalline BiFeO₃ thin films are investigated by using both conductive atomic force microscopy and current-voltage characteristic measurements. The local charge transport pathways are found to be located mainly at the grain boundaries of the films. The leakage current density can be tuned by changing the post-annealing temperature, the annealing time, the bias voltage and the light illumination, which can be used to improve the performances of the ferroelectric devices based on the BiFeO₃ films. A possible leakage mechanism is proposed to interpret the charge transports in the polycrystalline BiFeO₃ films.

Keywords:	polycrystalline BiFeO₃ thin films local leakage current conductive atomic force microscopy
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