Thickness-controlled Growth of Silicalite Membranes on Cerium Oxide Supports |
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| Authors: | Frank Krumeich Sebastian Abegg Andreas T Güntner |
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| Institution: | 1. Laboratory of Inorganic Chemistry, Department of Chemistry and Applied Biosciences, ETH Zürich, Vladimir-Prelog-Weg 1, 8093 Zürich, Switzerland;2. Particle Technology Laboratory, Department of Mechanical and Process Engineering, ETH Zürich, Sonneggstrasse 3, 8092 Zürich, Switzerland |
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| Abstract: | Layers of silicalite crystals with controlled thicknesses were deposited on cerium oxide porous disks by hydrothermal synthesis. The morphology and structure of the ceramic composites were characterized by scanning electron microscopy (SEM), X-ray powder diffraction (XRD) and (scanning) transmission electron microscopy ((S)TEM) and compared to zeolite layers on aluminum oxide supports. The elemental distribution, as visualized in elemental mappings by energy-dispersive X-ray spectroscopy (EDXS), confirm the formation of the zeolite layer and reveal the incorporation of zeolite crystals inside the pores of the supporting oxide. Zeolite layer integrity was assessed by gas permeation tests. These composites can be utilized as gas separators and can increase the selectivity of gas sensors or applied in catalysis. |
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| Keywords: | Elemental mapping Zeolites Membranes Layer growth: Electron microscopy |
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