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Estimation of band alignment at CdS/Cu2ZnSnS4 hetero-interface by direct XPS measurements |
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| Authors: | Charif Tamin Denis Chaumont Olivier Heintz Mohamed Adnane |
| Affiliation: | 1. Laboratoire Interdisciplinaire Carnot de Bourgogne (ICB UMR 6303 CNRS), Université de Bourgogne Franche-Comté, 9 Av. A. Savary, BP 47 870, Dijon Cedex, 21078 France;2. Laboratoire de Microscopie Electronique et Sciences des Matériaux (LMESM), Département de Technologie des Matériaux, Faculté de physique, Université des Sciences et de la Technologie d'Oran Mohamed Boudiaf USTO, USTO-MB, Oran, 31000 Algeria |
| Abstract: | This paper aims to estimate the band alignment to CdS/CZTS hetero-interface by direct X-ray photoelectron spectroscopy (XPS) measurements. XPS was used to determinate the valence-band offset (VBO) directly by determining the valence band positions at the hetero-interface. The conduction band offset (CBO) value was estimated based on the band gap measurements by UV/Visible spectroscopy and VBO measurements. The position of valence band (VB) changes close to the CdS-CZTS interface and the CBO is cliff-like. The band alignment diagram indicates that the CdS-CZTS interface heterojunction is type II. |
| Keywords: | CdS CZTS interface solar cells XPS |