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Alq_3发光层厚度对有机电致发光器件性能的影响
引用本文:Lian JR,Liao QS,Yang RB,Zheng W,Zeng PJ. Alq_3发光层厚度对有机电致发光器件性能的影响[J]. 光谱学与光谱分析, 2010, 30(10): 2616-2619. DOI: 10.3964/j.issn.1000-0593(2010)10-2616-04
作者姓名:Lian JR  Liao QS  Yang RB  Zheng W  Zeng PJ
作者单位:深圳大学光电子器件与系统教育部重点实验室,广东,深圳,518060
基金项目:国家自然科学基金项目,深圳大学科研基金项目 
摘    要:文章以MoO3为空穴注入层,NPB为空穴传输层,改变发光/电子传输层Alq3的厚度,考察了器件电学和光学性能的变化。结果表明,随着Alq3层增加厚度,器件的电流逐步减小,由此获得Alq3薄膜的电场分布情况;器件发光光谱有少量红移,但长波端明显展宽,短波端强度下降。该文拟合了器件电致发光谱,与实验曲线吻合较好。同时拟合结果也表明,干涉效应主要影响光谱在长波端的强度分布,发光区域分布决定光谱在短波端的强度分布。

关 键 词:有机发光二极管  发光层厚度  电致发光光谱  干涉效应  发光区域

Performance dependence of organic light-emitting devices on the thickness of Alq3 emitting layer
Lian Jia-rong,Liao Qiao-sheng,Yang Rui-bo,Zheng Wei,Zeng Peng-ju. Performance dependence of organic light-emitting devices on the thickness of Alq3 emitting layer[J]. Spectroscopy and Spectral Analysis, 2010, 30(10): 2616-2619. DOI: 10.3964/j.issn.1000-0593(2010)10-2616-04
Authors:Lian Jia-rong  Liao Qiao-sheng  Yang Rui-bo  Zheng Wei  Zeng Peng-ju
Affiliation:Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education, Shenzhen University, Shenzhen, China. ljr@szu.edu.cn
Abstract:The dependence of opto-electronical characteristics in organic light-emitting devices on the thickness of Alq3 emitter layer was studied, where MoO3, NPB, and Alq3 were used as hole injector, hole transporter, and emitter/electron transporter, respectively. By increasing the thickness of Alq3 layer from 20 to 100 nm, the device current decreased gradually, and the EL spectra of devices performed a little red shift with an obvious broadening in long wavelength range but a little decrease in intensity of short wavelength range. The authors simulated the EL spectra using the photoluminescence (PL) spectra of Alq3 as Alq3 intrinsic emission, which coincided with the experimental EL spectra well. The simulated results suggested that the effect of interference takes the major role in broadening the long wavelength range of EL spectra, and the distribution of emission zone largely affects the profile of EL spectra in short wavelength range.
Keywords:
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