Electron resonances in VLEED from Cu(111)

The sensitivity of the VLEED I–V curves to the shape and the position of the barrier is shown for the image- type surface barriers. For demonstration and comparison with experimental data the intensities of specularly reflected electron beams from Cu(111) are computed by dynamical theory of electron diffraction. Image plane position changes and modifications of the saturation shape of the surface barrier induce pronounced changes in the I–V curves calculated with the image-type barrier. Presented at the X-th Symposium on Suface Physics, Prague, Czech Republic, July 11–15, 2005.