Birefringence measurements of MnPc thin film by polarization microscopy |
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| Authors: | T. Hashimoto T. Kaito A. Mori |
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| Affiliation: | a Course in Optical Science and Technology, The University of Tokushima, 2-1 Minamijosanjima, Tokushima 770-8506, Japan
b Institute of Technology and Science, The University of Tokushima, 2-1 Minamijosanjima, Tokushima 770-8506, Japan |
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| Abstract: | We have studied optical properties of near-infrared (NIR) spectra and birefringence of the manganese phthalocyanine (MnPc) thin films. The morphology of the MnPc thin film grown on KCl (0 0 1) substrates was observed by using an atomic force microscope. The NIR spectral range of 1.0-1.7 μm was studied in this study, because that of 1.3-1.5 μm is known as an optical communication wavelength. The birefringence was measured with changing the growth condition of a deposition rate and a substrate temperature. The birefringence of the film was most affected by the deposition rate. |
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| Keywords: | Manganese-phthalocyanine KCl Birefringence |
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