Investigation of the magnetic field angle dependence of resistance, irreversibility field, upper critical field and critical current density in DC sputtered Bi-2223 thin film

We measured resistivity and transport critical current density, J_c, as a function of DC magnetic field and the angle (?) between the surface of the film and the magnetic field on ex-situ annealed, c-axis oriented Bi-2223 thin films fabricated by DC sputtering method. Irreversibility field (μ₀H_irr) and upper critical field (μ₀H_c2) were determined from the resistivity versus the applied magnetic field graph. It is observed that critical temperature (T_c), μ₀H_irr,μ₀H_c2 and J_c of the films strongly depend on the direction and strength of the field. While T_c of the film without magnetic field is observed to be about 102 K, it is found to decrease to 90 K (85 K) for the applied field perpendicular (parallel) to c-axis of the film. Not only were μ₀H_irr(0) and μ₀H_c2(0) values determined from the μ₀H_irr and μ₀H_c2 versus temperature graphs, respectively, but also penetration depths and coherence lengths were interpreted. Anisotropy of the film was also discussed by means of the change of irreversibility as a function of angle. Moreover at 4.2 K, J_c was observed to be 3000 A/cm² at zero field; however, it was found to abruptly decrease to 1982 (1 1 2 0) A/cm² under low magnetic field at ?=0° (?=90°), which indicates that anisotropic J_c behavior of the film is intrinsic. Furthermore, we provided a theoretical analysis of the obtained results in the framework of intrinsic pinning theory of superconductors. Microstructural properties of the produced films were also reinvestigated by X-ray diffractometer (XRD) and scanning electron microscopy (SEM) measurements. XRD patterns indicate that the films are c-axis oriented based on the prominent (0 0 l) peaks. SEM images show needle-like grain structures dominate the surface morphology of the films.