Complex surface three-dimensional shape measurement method based on defocused Gray code plus phase-shifting

Binary pattern defocused projection method can overcome the nonlinear gamma of the projector, as well as filter high harmonics and high-frequency noise. However, high-accuracy three-dimensional (3-D) shape measurement of complex surface using it still remains a challenge. Therefore, a novel Gray code plus phase-shifting method based on defocusing is proposed to solve the problem. The edges of Gray code patterns become blurred owing to defocus, which makes the recovery of accurate Gray code patterns difficult. To solve this problem, the positive and inverse Gray code patterns are projected to obtain threshold values, which are used to achieve the binarization of Gray code patterns. This method is robust and suitable for different defocus levels. Compared with the traditional Gray code plus phase-shifting method, the experimental results prove the effectiveness and feasibility of the proposed method.