Electron microscopic study of the crystallization kinetics of the amorphous alloy Pd80Si20

Amorphous Pd₈₀Si₂₀ foils, prepared by the rapidly rotating mill device method, were quenched from the liquid state, temperatures of the melt being 1100, 1500 and 1600°C. The foils were linearly heated at a rate of 1.5 °C/min over a temperature range of 20–600°C. The structural changes were observed by methods of optical microscopy, transmission electron microscopy and electron diffraction. The beginning of crystallization of the amorphous phase is affected by the temperature of the melt. The crystallization of the amorphous phase was terminated at a temperature of 390–400°C. Silicides Pd₉Si₂ and Pd₃Si, the morphology of which varied with temperature, were formed during crystallization.