Superconductivity in thin tin films: Fluctuation effects |
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| Authors: | Anil K. Bhatnagar Arun K. Saxena Belkis Gallardo |
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| Affiliation: | School of Physics, University of Hyderabad, Hyderabad 500 134, India;Department of Physics, St. John''s University, Jamaica, N.Y. 11432, USA |
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| Abstract: | The excess electrical conductivity in thin tin films due to thermodynamic fluctuations above Tc has been measured as a function of temperature and sheet resistance Rns of films which varied from 0.2 Ω/? to 120 Ω/?. Results have been compared with the Aslamazov-Larkin, Maki-Thompson and Patton theories. It is found that among three the Maki-Thompson theory gives a better fit to experimental data. The pair breaking parameter a fitting parameter in the M-T theory, is found to behave linearly with Rns of films and is given by ? ? 9x10?3 + 1.02x10?2Rns for Rns ≤ 12 Ω/?. |
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