Simple phase extraction in x-ray differential phase contrast imaging |
| |
| Affiliation: | Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China |
| |
| Abstract: | A fast and simple method to extract phase-contrast images from interferograms is proposed, and its effectiveness is demonstrated through simulation and experiment. For x-ray differential phase contrast imaging, a strong attenuation signal acts as an overwhelming background intensity that obscures the weak phase signal so that no obvious phase-gradient information is detectable in the raw image. By subtracting one interferogram from another, chosen at particular intervals,the phase signal can be isolated and magnified. |
| |
| Keywords: | x-ray imaging x-ray interferometry Talbot and self-imaging effects phase contrast imaging |
| 本文献已被 CNKI 等数据库收录！ |
| 点击此处可从《中国物理 B》浏览原始摘要信息 |
|
点击此处可从《中国物理 B》下载免费的PDF全文 |
|
