Simple phase extraction in x-ray differential phase contrast imaging |
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| Institution: | Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China |
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| Abstract: | A fast and simple method to extract phase-contrast images from interferograms is proposed, and its effectiveness is demonstrated through simulation and experiment. For x-ray differential phase contrast imaging, a strong attenuation signal acts as an overwhelming background intensity that obscures the weak phase signal so that no obvious phase-gradient information is detectable in the raw image. By subtracting one interferogram from another, chosen at particular intervals,the phase signal can be isolated and magnified. |
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| Keywords: | x-ray imaging x-ray interferometry Talbot and self-imaging effects phase contrast imaging |
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