Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica |
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Institution: | 1. School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China;2. Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China |
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Abstract: | Modulation caused by surface/subsurface contaminants is one of the important factors for laser-induced damage of fused silica. In this work, a three-dimensional finite-difference time-domain (3D-FDTD) method is employed to simulate the electric field intensity distribution in the vicinity of particulate contaminants on fused silica surface. The simulated results reveal that the contaminant on both the input and output surfaces plays an important role in the electric field modulation of the incident laser. The influences of the shape, size, embedded depth, dielectric constant (εr), and the number of contaminant particles on the electric field distribution are discussed in detail. Meanwhile, the corresponding physical mechanism is analyzed theoretically. |
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Keywords: | fused silica laser-induced damage particulate contaminants modulation |
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