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Highly uniform growth in a low-pressure MOVPE multiple wafer system
Authors:Takayuki Arai  Junichi Hidaka  Hiroki Tokunaga  Koh Matsumoto
Institution:

a Electronic Business Division, Nippon Sanso Co., 10 Ohkubo, Tsukuba, Ibaraki 300-26, Japan

b Tsukuba Laboratory, Nippon Sanso Co., 10 Ohkubo, Tsukuba, Ibaraki 300-26, Japan

Abstract:A novel horizontal metal organic vapor phase epitaxy (MOVPE) system, which is capable of handling six 3 inch wafers or eighteen 2 inch wafers mounted on a 10 inch diameter susceptor, has been developed for the growth of III–V compound semiconductors. The characteristic features in this system are “triple flow channel” gas injection and “face-down” wafer setting configuration. The inlet for the source gas flow is divided into three zones (upper, middle and lower flows for hydrides, organometals and hydrogen, respectively) to control the concentration boundary layer and the growth area. The wafers are placed inversely to prevent thermal convection and particles on the growing surface. The independent controlled three-part heating system is also adopted to achieve a uniform temperature distribution over an 8 inch growing surface. The thickness and the doping of GaAs, Al0.3Ga0.7As, In0.48Ga0.52P and In0.2Ga0.8As grown by this system are uniform within ± 2% over all 3 inch wafers.
Keywords:
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