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磷石膏中微量含氟物相的光谱分析
引用本文:赵红涛,李会泉,包炜军,王晨晔,李松庚,林伟刚.磷石膏中微量含氟物相的光谱分析[J].光谱学与光谱分析,2015,35(8):2333-2338.
作者姓名:赵红涛  李会泉  包炜军  王晨晔  李松庚  林伟刚
作者单位:1. 中国科学院过程工程研究所,湿法冶金清洁生产技术国家工程实验室,北京 100190
2. 中国科学院大学,北京 100049
3. 中国科学院过程工程研究所,多相复杂系统国家重点实验室,北京 100190
基金项目:国家自然科学基金项目,科技部“十二五”国家科技支撑计划项目
摘    要:磷石膏中二水硫酸钙(CaSO4·2H2O)的含量高达90%以上,是一种重要的再生石膏资源。然而与天然石膏不同,磷石膏中磷、氟、有机物等有害杂质限制了它的实际利用。探明微量杂质氟物相的存在形态、含量及分布规律,对高效脱除磷石膏中杂质氟具有重要的理论价值。采用X射线光电子能谱(X-ray photoelectron spectroscopy, XPS)与电子显微探针(electron microprobe analysis, EMPA)相结合的分析方法,研究了磷石膏中微量含氟物相的主要存在形式和分布规律。结果表明,磷石膏中微量含氟物相主要包括NaF,KF,CaF2,K2SiF6,Na2SiF6,Na3AlF6,K3AlF6,AlF3·3H2O,AlF2.3(OH)0.7·H2O,Ca5(PO4)3F,Ca10(PO4)6F2。其中,4.83%的氟以NaF,KF,CaF2等氟化物形式存在,8.42%的氟以氟磷酸盐Ca5(PO4)3F和Ca10(PO4)6F2形式存在,12.21%的氟以氟铝酸盐Na3AlF6和K3AlF6形式存在,41.52%的氟以氟硅酸盐K2SiF6和Na2SiF6形式存在,33.02%的氟以带结晶水的氟化铝AlF3·3H2O和AlF2.3(OH)0.7·H2O形式存在。研究表明分析固体样品中微量元素物相时,采用XPS与EMPA相结合的分析方法更具有优势。本研究为磷石膏中微量杂质氟的脱除以及有效回收氟资源提供理论依据。

关 键 词:磷石膏    物相分布  XPS  EMPA    
收稿时间:2014-06-09

Spectral Analysis of Trace Fluorine Phase in Phosphogypsum
ZHAO Hong-tao,LI Hui-quan,BAO Wei-jun,WANG Chen-ye,LI Song-geng,LIN Wei-gang.Spectral Analysis of Trace Fluorine Phase in Phosphogypsum[J].Spectroscopy and Spectral Analysis,2015,35(8):2333-2338.
Authors:ZHAO Hong-tao  LI Hui-quan  BAO Wei-jun  WANG Chen-ye  LI Song-geng  LIN Wei-gang
Institution:1. National Engineering Laboratory for Hydrometallurgical Cleaner Production Technology, Institute of Process Engineering, Chinese Academy of Sciences, Beijing 100190, China2. University of Chinese Academy of Sciences, Beijing 100049, China3. State Key Laboratory of Multiphase Complex Systems, Institute of Process Engineering, Chinese Academy of Sciences, Beijing 100190, China
Abstract:Phosphogypsum, which contains more than 90% of the calcium sulfate dihydrate(CaSO4·2H2O), is a kind of important renewable gypsum resources. Unlike the natural gypsum, however, phosphorus, fluorine, organic matter and other harmful impurities in phosphogypsum limit its practical use. To ascertain the existence form, content and phase distribution of trace fluoride in phosphogypsum has important theoretical values in removing trace fluoride effectively. In this present paper, the main existence form and phase distribution of trace fluoride in phosphogypsum was investigated by the combination of X-ray photoelectron spectroscopy (XPS) and Electron microprobe analysis (EMPA). The results show that trace fluoride phase mainly includes NaF, KF, CaF2, K2SiF6, Na2SiF6, Na3AlF6, K3AlF6, AlF3·3H2O, AlF2.3(OH)0.7·H2O, Ca5(PO4)3F, Ca10(PO4)6F2. Among them, 4.83% of fluorine exists in the form of fluoride (NaF, KF, CaF2); Accordingly, 8.43% in the form of fluoride phosphate(Ca5(PO4)3F, Ca10(PO4)6F2); 12.21% in the form of fluorine aluminate(Na3AlF6, K3AlF6); 41.52% in the form of fluorosilicate(K2SiF6, Na2SiF6); 33.02% in the form of aluminum fluoride with crystal water(AlF3·3H2O, AlF2.3(OH)0.7·H2O). In the analysis of phase constitution for trace elements in solid samples, the method of combining XPS and EMPA has more advantages. This study also provides theoretical basis for the removal of trace fluorine impurity and the effective recovery of fluorine resources.
Keywords:Phosphogypsum  Fluorine  Phase distribution  XPS  EM PA
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