| 用横向光热偏转技术测量光学薄膜的微弱光吸收 |
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| 引用本文： | 吴周令,唐晋发,施柏煊. 用横向光热偏转技术测量光学薄膜的微弱光吸收[J]. 光学学报, 1988, 0(11) |
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| 作者姓名： | 吴周令 唐晋发 施柏煊 |
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| 作者单位： | 浙江大学光仪系，浙江大学光仪系，浙江大学光仪系 中国科学院上海光学精密机械研工究所 |
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| 摘 要： | 用横向光热偏转技术(TPDS)测量光学薄膜的弱吸收,灵敏度达10~(-5).因为薄膜样品在调制频率较低时属热薄试样,本文基于这一原理实现了TPDS的精密定标.
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| 关 键 词： | 光热偏转光谱术 薄膜弱光吸收 |
Measurement of Weak Absorptions of Optical Coatings By Transverse Photothermal Deflection Technique |
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| Wu ZHOULINS TANG JINFA SHI BAIXUAN. Measurement of Weak Absorptions of Optical Coatings By Transverse Photothermal Deflection Technique[J]. Acta Optica Sinica, 1988, 0(11) |
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| Authors: | Wu ZHOULINS TANG JINFA SHI BAIXUAN |
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| Abstract: | Weak absorptions of optical coatings are measured by transverse photothermal deflection speotroscopy (TPDS) with a sensitivity of as high as 10~(-5). The experimental results are in good agreement with those measured by a laser calorimeter. |
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| Keywords: | phototherma deflection speotrosoopy weak absorption. |
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