Impact of multiplexed reading scheme on nanocrossbar memristor memory’s scalability |
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Authors: | Zhu Xuan Tang Yu-Hua Wu Chun-Qing Wu Jun-Jie Yi Xun |
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Institution: | a State Key Laboratory of High Performance Computing, National University of Defense Technology, Changsha 410073, China;b School of Computer, National University of Defense Technology, Changsha 410073, China |
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Abstract: | Nanocrossbar is a potential memory architecture to integrate memristor to achieve large scale and high density memory. However, based on the currently widely-adopted parallel reading scheme, scalability of the nanocrossbar memory is limited, since the overhead of the reading circuits is in proportion with the size of the nanocrossbar component. In this paper, a multiplexed reading scheme is adopted as the foundation of the discussion. Through HSPICE simulation, we reanalyze scalability of the nanocrossbar memristor memory by investigating the impact of various circuit parameters on the output voltage swing as the memory scales to larger size. We find that multiplexed reading maintains sufficient noise margin in large size nanocrossbar memristor memory. In order to improve the scalability of the memory, memristors with nonlinear I–V characteristics and high LRS (low resistive state) resistance should be adopted. |
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Keywords: | nanocrossbar memristor multiplexing reading circuit voltage swing |
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