Optical low-coherence reflectometry with resolution beyond the Fourier transform limit

We demonstrate experimentally and theoretically a method for enhancing the axial resolution of optical low-coherence reflectometry (OLCR) beyond the Fourier transform limit of light source spectrum. The resolution enhancement originates from the superposition of multiple OLCR scans with different offsets of the center-wavelength light-ray with respect to the rotation axis of the mirror mounted on the galvanometer optical scanner in the used optical phase delay line. After certain software process of the multiple scan fringe patterns of different offsets, the superposition leads to an OLCR axial resolution beyond the transform limit. Experimentally, by using four different offsets for superposition, about 1.5 times enhancement of the transform-limit resolution is obtained.