Determining and Controlling the Magnesium Composition
in CdTe/CdMgTe Heterostructures |
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| Authors: | E G LeBlanc M Edirisooriya O S Ogedengbe O C Noriega P A R D Jayathilaka S Rab C H Swartz D R Diercks G L Burton B P Gorman A Wang T M Barnes T H Myers |
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| Institution: | 1.Materials Science, Engineering & Commercialization Program,Texas State University,San Marcos,USA;2.Colorado School of Mines,Golden,USA;3.National Renewable Energy Laboratory,Golden,USA;4.EAG Laboratories (Evans Analytical Group),Sunnyvale,USA |
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| Abstract: | The relationships between Mg composition, band gap, and lattice characteristics are investigated for Cd1?x Mg x Te barrier layers using a combination of cathodoluminescence, energy dispersive x-ray spectroscopy, variable angle spectral ellipsometry, and atom probe tomography. The use of a simplified, yet accurate, variable angle spectral ellipsometry analysis is shown to be appropriate for fast determination of composition in thin Cd1?x Mg x Te layers. The validity of using high-resolution x-ray diffraction for CdTe/Cd1?x Mg x Te double heterostructures is discussed. The stability of CdTe/Cd1?x Mg x Te heterostructures are investigated with respect to thermal processing. |
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