Direct determination of trace elements in tungsten products using an inductively coupled plasma optical emission charge coupled device detector spectrometer |
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| Institution: | 1. School of Metallurgy and Materials Engineering, Iran University of Science and Technology, P.O. Box: 16845-161, Tehran, Iran;2. University of Toronto, Department of Materials Science and Engineering, 170 College Street, Suite 230, Toronto, ON M5S 3E3, Canada;1. Postgrado en Ciencia e Ingeniería de Materiales, UNAM, Apartado Postal 70-360, Coyoacán 04510, México, D.F., Mexico;2. Departamento de Materiales Metálicos y Cerámicos, Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Apartado Postal 70-360, Coyoacán 04510 México, D.F., Mexico;3. Centro de Investigación en Ciencia Aplicada y Tecnología Avanzada del Instituto Politécnico Nacional, Unidad Legaria, Calzada Legaria 694, Colonia Irrigación, Código Postal 11500, México, D.F., Mexico;4. Departamento de Física, CINVESTAV-IPN, Apartado Postal 14-740, 07000 México, D.F., Mexico;1. National Center for Compositional Characterization of Materials (NCCCM), Bhabha Atomic Research Centre, Department of Atomic Energy, Hyderabad 500 062, India;2. National Metallurgical Laboratory, Jamshedpur 831 007, India;1. SENSOR Laboratory, University of Brescia, Via D. Valotti 9, 25133 Brescia, Italy;2. CNR-INO, SENSOR Laboratory, Brescia, Italy;1. Department of Mechanical Engineering, Boston University, 110 Cummington St., Boston, MA, 02215, USA;2. Division of Materials Science and Engineering, Boston University, 15 Saint Mary''s St., Brookline, MA, 02446, USA |
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| Abstract: | An echelle inductively coupled plasma optical emission spectrometer equipped with a segmented array of charge coupled device detectors was used for the direct determination of trace impurities in tungsten products. No sample preparation was necessary. The multicomponent spectral fitting software provided by the instrument was used for the correction of spectral interference and background. The detection limits of the trace elements Al, As, Bi, Ca, Cd, Co, Cr, Cu, Fe, K, Mg, Mn, Mo, Ni, P, Pb, Sb, Sn, Ti and V in tungsten matrix were obtained under optimized operating conditions. The accuracy of the proposed method was assessed using three National Reference Materials. As a result of their ultra-trace concentrations in the reference materials, As, Pb and Sn could not be determined satisfactorily. The concentrations found for the other elements agreed quite well with those of the certified values of the reference materials. |
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