Surface structure of silica gel reacted with 3-mercaptopropyltriethoxysilane and 3-aminopropyltriethoxysilane: formation of the S–S bridge structure and its characterization by Raman scattering and diffuse reflectance Fourier transform spectroscopic studies |
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| Authors: | H Okabayashi K Izawa T Yamamoto H Masuda E Nishio C J O'Connor |
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| Institution: | (1) Department of Applied Chemistry Nagoya Institute of Technology Gokiso-cho, Showa-ku Nagoya 466-8555, Japan, JP;(2) PerkinElmer Japan Co. Ltd. Kittasaiwai 2-8-4, Nishiku Yokohama 220-0004, Japan, JP;(3) Department of Chemistry The University of Auckland Private Bag 92019 Auckland 1, New Zealand, NZ |
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| Abstract: | Silica gel samples, modified with 3-mercaptopropyltriethoxysilane, and their S–S-bridged samples have been prepared. In order
to characterize the microstructure of the surface of these silica gel samples, Raman scattering and diffuse reflectance Fourier
transform IR spectra of these samples have been examined by comparison with Raman spectra of various n-alkyl disulfides and their related silane polymers. The S–S and C–S stretch modes characteristic of the CH2SSCH2 segment, in addition to the SH and C–S stretch modes of the CH2SH segment, have been assigned for these silica gel samples. It has been found that, even on the surface of the silica gel,
a specific conformer is stabilized about the CH2SSCH2 segment.
Received: 1 May 2001 Accepted: 16 June 2001 |
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| Keywords: | 3-mercaptopropyltriethoxy silane-modified silica gel S-S bridge structure Raman and DRIFT spectra |
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