Structural characterisation of CdS layers deposited on porous p-type GaAs |
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Authors: | Ali Missaoui Mounir Gaidi Hafedh Ben Ouada |
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Institution: | a Laboratoire de Physique et de Chimie des Interfaces, Faculté des Sciences de Monastir, Bd de l’Environnement 5019 Monastir, Tunisia b INRS- Energie, Matériaux et Télécommunications, Varennes, Qué., Canada |
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Abstract: | The purpose of this paper is to investigate the initial stage of cadmium sulphide (CdS) layer deposited on porous p-type GaAs substrate by vacuum evaporation technique. The deposited CdS layer was investigated by scanning electron microscopy (SEM), atomic force microscopy (AFM) and X-ray diffraction (XRD). SEM imaging shows that the CdS was penetrated deeply in the porous structure down to the bottom and reaching the interface GaAs/porous GaAs. The AFM image demonstrates that the CdS deposited are grains of several nanometres and XRD patterns exhibit that the deposited layer has a hexagonal prominent phase. |
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Keywords: | 81 05 Ea 81 05 Rm 81 05 Dz 81 15 Ef |
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